We offer improved ruggedness and robustness testing in our power electronics characterization lab using:
Unclamped Inductive Load Switching Tests (UIS):
- up to 2.5kV and 200A with changeable coil values from 10uH to 25mH
- time resolution 25 ns
Short Circuit Withstand Time (SCWT):
- up to 1700A and 1200V with L_stray = 50nH
- 10 us pulsed for 1700A