Picture of UEM
Current status:
AVAILABLE
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Technical description
Full equipment name: JEOL JEM-2100
General purpose:
Ultrafast Electron Microscope (UEM) or time resolved transmission electron microscope (TEM)  with a time resolution of a few hundred femtoseconds. Capacity to perform time resolved TEM imaging, diffraction and electron energy loss spectroscopy (EELS), Lorentz microscopy, energy filetered imaging, etc.

Tool name:
UEM
Area/room:
Y-SEM labs
Category:
Surface analysis & TEM
Manufacturer:
JEOL JEM-2100
Model:
Ultrafast Electron Microscopy
Tool rate:
E

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