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FIB/SEM Albanova (101)

Current status:

DOWN

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Responsibles

1st Responsible:

Taras P Golod

2nd Responsible:

Files

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Description

FEI Nova 200 dual beam system.

Scanning electron microscope and focussed ion beam, gallium source for ion beam, one gas injector for platinum deposition.

Details

Tool name:

FIB/SEM Albanova

Area/room:

Albanova E1:1015A

Category:

Surface analysis & TEM

Manufacturer:

FEI Company

Model:

Nova 200

Tool rate:

Tool Modes

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