Surge current behaviours are studied using a special-design single-pulse tester 
Measurement specifications:
- Half sinus for testing SiC diodes and FETs
- Very high current amplitude from 1A to 400 A
- Packages TO220, TO247, and 1 to 25 mm2 chips
- Very short pulse times from 2 µs to 10 µs
- Integrated heater for DUT
- Kelvin terminals
- Direct control of end-user parameters