Picture of FIB/SEM Albanova
Current status:
WARNING
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Responsibles
1st Responsible:
Taras P Golod
2nd Responsible:
Adrian Iovan
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Description

FEI Nova 200 dual beam system.

Scanning electron microscope and focussed ion beam, gallium source for ion beam, one gas injector for platinum deposition.

Info and Manuals.

Details
Tool name:
FIB/SEM Albanova
Area/room:
Albanova E1:1015A
Category:
Surface analysis & TEM
Manufacturer:
FEI Company
Model:
Nova 200
Tool rate:
D
Instructors & Licensed Users

Instructors

Licensed Users

Tool Modes
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