General description: Electric/Magnetic Characterization

Technical description
Full equipment name: Electroglas 2001X
General purpose: Autamatical wafers scale measurements
Technical Data:
- Fully automatic casette-to-casette wafer prober 
- Wafer size: 100 mm, 150 mm and 200 mm 
- Standard probe cards compatible
- Two micro manipulators available (needle probes)
- Prober controlled through LAbView
- A module for IV measurements is available