Picture of ALD
Current status:
AVAILABLE
Book | Log
Show/Collapse all

1st Responsible:
2nd Responsible:
You must be logged in to view files.

Technical description
Full equipment name: BENEQ TFS 200
General purpose:
Atomic Layer Deposition of metals and dielectrics
Technical data:
Process chambers for thermal ALD
4 Liquid source positions
2 Hot source (Tmax=300C) positions
Gases:
N2, NH3, O2, O3
Liquid precursors
- Trimethylaluminum (TMA), Al2(CH3)6
- Titaniumtetrachloride (TiCl4)
- AP-LTO-330 (commercial name for Si precursor by Airproduct)
- Water (H2O)

Hot source pecursors
- Bis(methylcyclopentadienyl)methoxymethylhafnium (HfD04), Hf[C5H4(CH3)]2(OCH3)CH3
- Tris(cyclopentadienyl)thulium(III) (TmCp3)

 

Tool name:
ALD
Area/room:
C-Anneal
Category:
Thin film deposition
Manufacturer:
BENEQ
Model:
TFS200
Tool rate:
D

Thickness per cycle and uniformity on 100mm wafer:

Recipe Rate (nm/cycle) Uniformity Updated
A_std_Al2O3 0.1086±0.0012 <2% 2024-01-22
A_std_TiO2 0.06±0.0016 <2% 2021-03-30
A_std_SiO2 0.141±0.001 <2% 2023-10-04
A_std_HfO2_with_O3 0.064±0.002 <7% 2023-10-18
A_std_HfO2 0.035±0.003 <16% 2022-09-21
A_std_TiN 0.0206±0.0002 <5% 2021-08-20
Tm2O3 thermal Strem 4in 0.2±0.02 5-6% 2021-03-30

 

 

Instructors

Licensed Users

You must be logged in to view tool modes.