Picture of FIB-SEM
Current status:
AVAILABLE
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1st Responsible:
2nd Responsible:
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Focused Ion Beam Field Emission Scanning Electron Microscope with low vaccum mode option and environmental mode option including cold stage and hot stage(up to 1000 degree celsius).

Tool name:
FIB-SEM
Area/room:
Y-SEM labs
Category:
Surface analysis & TEM
Manufacturer:
FEI
Model:
QUANTA 3D FEG
Tool rate:
D
Max booking time, day:
10 hours
Max booking time, night:
hours
No. of future bookings:
3

Instructors

Licensed Users

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