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Current status:
AVAILABLE
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Technical description
Full equipment name: RDP transducer indicator E307-1
General purpose: Measure the wafer thickness
Technical data:
Thickness measurement range:0 to 1 µm
Accuracy: + 0,5 µm
All wafer size and piece of wafer
Equipment inventory:
Two probes, A and B
One calibration wafer 5216-5
 

Tool name:
Skivthk
Area/room:
C-Wet Chemistry
Category:
Metrology
Manufacturer:
Mitutoyo
Model:
RDP transducer indicator E307-1
Tool rate:
A
Max booking time, day:
hours
Max booking time, night:
hours
No. of future bookings:

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